Cost of Cheap Decisions

From QA Challenges to Innovation with PRIZ

The reenactment by Dr. Thinkman and Debra highlights a semiconductor manufacturing crisis where cost-cutting decisions clash with quality control. It illustrates the critical role of systematic problem-solving and the PRIZ Platform in identifying hidden relationships within manufacturing processes. The omission of the plasma cleaning step inadvertently caused wafer deformation, underscoring the importance of understanding complete functional relationships for engineering excellence. The broader lesson emphasizes prioritizing quality over short-term savings to prevent costly failures, using structured methodologies to maintain long-term success.
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