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Elemental Analysis of Semiconductors: Identification and quantification of element distributions in semiconductor nanostructures
Manage episode 300275387 series 2948885
תוכן מסופק על ידי Bruker Nano Analytics. כל תוכן הפודקאסטים כולל פרקים, גרפיקה ותיאורי פודקאסטים מועלים ומסופקים ישירות על ידי Bruker Nano Analytics או שותף פלטפורמת הפודקאסט שלהם. אם אתה מאמין שמישהו משתמש ביצירה שלך המוגנת בזכויות יוצרים ללא רשותך, אתה יכול לעקוב אחר התהליך המתואר כאן https://he.player.fm/legal.
In today’s episode, we are joined by Dr. Meiken Falke, Global Product Manager EDS/TEM, and Hosanna Lillydahl-Schroeder, Senior Applications Scientist, to discuss the use of TEM for semiconductor analysis.
Webinars:
TEM, STEM and T-SEM EDS Quantification at its Best -https://www.bruker.com/en/news-and-events/webinars/2019/tem-stem-and-t-sem-eds-quantification-at-its-best.html
Nanostructural Characterization of Semiconductors with SEM https://www.bruker.com/en/news-and-events/webinars/2020/nanostructural-characterization-of-semiconductors-with-sem.html
New Windowless EDS detector - Link to intro of Oval 100mm2 for TEM: https://www.bruker.com/en/news-and-events/webinars/2020/new-windowless-EDS-detector-100-oval.html
Abstracts and Whitepapers:
Paper recommended in session: Coherent Bremsstrahlung effect observed during STEM analysis of dopant distribution in silicon devices using large area silicon drift EDX detectors and high brightness electron source
R.Pantel, Ultramicroscopy, Volume 111, Issue 11, November 2011, Pages 1607-1618
https://www.sciencedirect.com/science/article/abs/pii/S0304399111002117
Website:
https://www.bruker.com/en/products-and-solutions/elemental-analyzers/eds-wds-ebsd-SEM-Micro-XRF.html
Contact Us:
+1 800-234-XRAY(9729)
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